[. . . ] [. . . ] Cadence QuickView provides pan, zoom, and measure capabilities with a wide range of user preference options including colors, fill patterns, and line styles in a multiple window environment. A "replay" macro capability enables the capture of useful command sequences for customization, repetition, and future reuse. Cadence® QuickView is an easy-to-use, high-performance, standalone system for viewing and superimposing layout and manufacturing data in various formats. It offers design and manufacturing teams a highly extensible tool for viewing, analyzing, and comparing layout and manufacturing data. Server executive Client executive Data file(s) Figure 1: Concurrent viewing of multiple formats GDSII OASIS MEBES Utilities Bitmap Separate cooperating child processes BeneFiTS · Multi-formatdisplaycapabilitiesenable the viewing and superimposing of design data in any of its intermediate conditions throughout the designfinishing process · Offershigh-performance, high-capacity data viewing with powerful options that allow the full range of display, from deep sub-micron features to full reticle or mask-level databases · IntelligentoverlayandgraphicalXOR capabilities make graphical comparisons of data easy by providing an additional element of decision support · Enablesgraphicalverificationofreticle designs based on the actual data used in mask manufacturing, which eliminates expensive jobdeck errors and improves the predictability of cycle times · Enablescoordinatescaling, off-setting, rotation, and/or mirroring for overlaying and comparing multiple datasets · Enablesfastandpowerfulmeasurement and analysis · Crosstalkcommunicationsfeature enables graphical communication among multiple sites with remote pan, zoom, measure, and screen mark up, minimizing the need for plotting and printing · Offersefficientandgenericmeansof displaying and stepping through DrC error diagnostics results · Displaysbitmapimages, enablingdirect graphical comparison with any other supported format · Acceptsindustry-standardformats · OffersaconfigurableGUI · Includesafull-featuredmacrolanguage for the development of custom viewing and data inspection applications · Maybeviewedconcurrentlytoverify changes, alignment, or interaction · Maybeviewedmirrored, rotated, scaled, and offset · Maybeviewedinnormalorreversetone · Stripeandsegmentboundaries, aswell as virtual addressing, may be superimposed on the pattern data · Patternstatisticsaremadeavailable using the QuickView "identify" and "analyze" commands · Rapiddisplayofcompletemaskor reticle data in fractured format using manufacturing-ready jobdecks and appropriate data files · Usefulstatisticalinformationmaybe extracted and displayed FeaTuReS ViewinG LaYOuT FORMaTS · Supportsmultiplelayoutformats: ­ gDSII ­ oASIS ­ openAccess ­ LAff ­ gL/1 · Maybeviewedconcurrentlytoverify changes, alignment, or interaction without the worry of cell name collisions · Maybeviewedmirrored, rotated, scaled, and offset · Variousdataqueryfunctionsareavailable including hierarchical listings, reference and geometry status commands, and a cell finder · Ageneralpurposestepperautomatically pans and zooms to cell instances, as well as geometric properties and attributes CadenCe SeRViCeS and SuPPORT · Cadenceapplicationengineerscan answer your technical questions by telephone, email, or internet -- they can also provide technical assistance and custom training · SourceLink® online customer support gives you answers to your technical questions -- 24 hours a day, 7 days a week -- including the latest in quarterly software rollups, product release information, technical documentation, software updates, and more · Cadence-certifiedinstructorsteachmore than 80 courses and bring their realworld experience into the classroom · Morethan25InternetLearningSeries (iLS) online courses allow you the flexibility of training at your own computer via the Internet ViewinG ManuFaCTuRinG FORMaTS and JOBdeCkS · Supportsleadingmanufacturingformats: ­ MEBES through Mode 5 (data, jobdecks, SemiP10) ­ JEoL 2. 1, 3. 0, and 3. 1 (data and jobdecks) ­ Toshiba VSB 11and 12 (data and jobdecks) ­ HL800, HL900, and HL950 (data) For more information, log on to: or email: www. cadence. com k2_support@cadence. com © 2008 Cadence design Systems, inc. Cadence is a trademark and the Cadence logo is a registered trademark of Cadence design Systems, inc. [. . . ] [. . . ]